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3 edition of 1997 2nd International Workshop on Statistical Metrology found in the catalog.

1997 2nd International Workshop on Statistical Metrology

IWSM, June 8, 1997, Kyoto

by International Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan)

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  • 3 Currently reading

Published by IEEE in Piscataway, NJ .
Written in English

    Subjects:
  • Semiconductors -- Characterization -- Statistical methods -- Congresses.,
  • Semiconductors -- Measurement -- Statistical methods -- Congresses.

  • Edition Notes

    Other titles2nd International Workshop on Statistical Metrology, International Workshop on Statistical Metrology
    Statementsponsored by IEEE Electron Devices Society ; in cooperation with Japan Society of Applied Physics ... [et al.].
    ContributionsIEEE Electron Devices Society., Ōyō Butsuri Gakkai.
    Classifications
    LC ClassificationsTK7871.85 .I5837x 1997
    The Physical Object
    Paginationvi, 124 p. :
    Number of Pages124
    ID Numbers
    Open LibraryOL19816200M
    ISBN 100780337379, 0780337387

    18th International Workshop on Statistical Modelling July 7–11, , Leuven, Belgium Geert Verbeke, Geert Molenberghs, Marc Aerts, & Steffen Fieuws. The Physikalisch-Technische Bundesanstalt (PTB) is the national metrology institute providing scientific and technical services. PTB measures with the highest accuracy and reliability – metrology as the core competence.

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    Scientific and Statistical Database Management: 22nd International Conference, SSDBM , Heidelberg, Germany, June July 2, , Proceedings (Lecture Notes in Computer Science ()) [Gertz, Michael, Ludäscher, Bertram] on *FREE* shipping on qualifying offers. Scientific and Statistical Database Management: 22nd International Conference, Format: Paperback. science, statistical data analysis, system theory. He is currently the chairman of the TC1 (Terminology) and the secretary of the TC25 (Quantities and Units) of the International Electrotechnical Commission (IEC), and an IEC expert in the WG2 (VIM) of the Joint Committee for Guides in Metrology (JCGM). He has been the chairmanFile Size: KB.


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1997 2nd International Workshop on Statistical Metrology by International Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan) Download PDF EPUB FB2

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2nd International Workshop on Statistical Metrology, June 8,Kyoto. [New York]: Institute of Electrical and Electronics Engineers, © (DLC) (OCoLC) Material Type: Conference publication, Document, Internet resource: Document Type.

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